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Test pattern variance, issue #20 and documentation updates #22
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krzychb
commented
Dec 31, 2016
krzychb
commented
- Test pattern variance to aid troubleshooting of issues with image retrieval
- Option to reverse 442ca8a to troubleshoot issue After fixing Issue #11, OV7725 is unable to operate @ 20MHz XCLK #20
- Alternate pin mappig to quickly switch from default pinout / demonstrate flexibility of pin selection
- Documentation updates
- Alternate pin mapping
- Description of s/w application components
- Using test pattern variance
- Updated output logs
1. Implemented calculation of test pattern variance to aid troubleshooting of issues with signal lines / image retrieval 2. Issue igrr#20 – Added option to reverse igrr@442ca8a to troubleshoot issue igrr#20
1. Alternate pin mapping 2. Description of s/w application components 3. Using test pattern variance 4. Updated output logs
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Thank you @krzychb, I've cherry-picked "documentation update" and LICENSE commits into master. 20MHz mode is fixed for OV7725 now, so I didn't merge the troubleshooting changes. |
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