Scoring Bayesian Neural Networks for Learning from Inconsistent Labels in Surface Defect Segmentation https://authors.elsevier.com/sd/article/S0263-2241(23)01562-2
Please cite this article as: T. Niu, B. Chen, Q. Lyu et al., Scoring Bayesian Neural Networks for learning from inconsistent labels in surface defect segmentation, Measurement (2023), doi:https://doi.org/10.1016/j.measurement.2023.113998.
@article{niu2023scoring,
title={Scoring Bayesian Neural Networks for learning from inconsistent labels in surface defect segmentation},
author={Niu, Tongzhi and Chen, Biao and Lyu, Qianhang and Li, Bei and Luo, Wei and Wang, Zhenrong and Li, Bin},
journal={Measurement},
pages={113998},
year={2023},
publisher={Elsevier} }