drivers: adc: adc_sam_afec: rework device tree support #24580
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Reworked adc_sam_afec driver to utilize new DT_INST macros as part of this rework we also now get pin ctrl/mux configuration information from the device tree instead of via Kconfig and defines in soc_pinmap.h We remove defines from dts_fixup.h and soc_pinmap.h and associated Kconfig symbols that are no longer needed due to getting all that information from devicetree. Signed-off-by: Kumar Gala <[email protected]>
galak
added
area: ADC
61 tasks
nandojve
approved these changes
Apr 23, 2020
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Tested with SAM_V71_XULT
*** Booting Zephyr OS build zephyr-v2.2.0-1872-ga568a5ef993d ***
Running test suite adc_basic_test
===================================================================
starting test - test_adc_sample_one_channel
Samples read: 0x0fc6 0x0000 0x0000 0x0000 0x0000 0x0000
PASS - test_adc_sample_one_channel
===================================================================
starting test - test_adc_sample_two_channels
SKIP - test_adc_sample_two_channels
===================================================================
starting test - test_adc_asynchronous_call
Samples read: 0x0f51 0x0f8c 0x0f81 0x0f91 0x0f81 0x0000
PASS - test_adc_asynchronous_call
===================================================================
starting test - test_adc_sample_with_interval
sample_with_interval_callback: sampling 0
sample_with_interval_callback: sampling 1
sample_with_interval_callback: sampling 2
sample_with_interval_callback: sampling 3
sample_with_interval_callback: sampling 4
Samples read: 0x0f4c 0x0f4f 0x0f50 0x0f4f 0x0f52 0x0000
PASS - test_adc_sample_with_interval
===================================================================
starting test - test_adc_repeated_samplings
repeated_samplings_callback: done 1
Samples read: 0x0f59 0x0000 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 2
Samples read: 0x0f59 0x0f53 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 3
Samples read: 0x0f52 0x0f53 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 4
Samples read: 0x0f53 0x0f53 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 5
Samples read: 0x0f51 0x0f53 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 6
Samples read: 0x0f58 0x0f53 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 7
Samples read: 0x0f50 0x0f53 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 8
Samples read: 0x0f51 0x0f53 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 9
Samples read: 0x0f51 0x0f53 0x0000 0x0000 0x0000 0x0000
repeated_samplings_callback: done 10
Samples read: 0x0f54 0x0f53 0x0000 0x0000 0x0000 0x0000
PASS - test_adc_repeated_samplings
===================================================================
starting test - test_adc_invalid_request
E: ADC resolution value 0 is not valid
E: ADC resolution value 0 is not valid
Samples read: 0x0f56 0x0000 0x0000 0x0000 0x0000 0x0000
PASS - test_adc_invalid_request
===================================================================
Test suite adc_basic_test succeeded
===================================================================
PROJECT EXECUTION SUCCESSFUL
stephanosio
approved these changes
Apr 23, 2020
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Reworked adc_sam_afec driver to utilize new DT_INST macros as part of
this rework we also now get pin ctrl/mux configuration information
from the device tree instead of via Kconfig and defines in soc_pinmap.h
We remove defines from dts_fixup.h and soc_pinmap.h and associated
Kconfig symbols that are no longer needed due to getting all that
information from devicetree.
Signed-off-by: Kumar Gala [email protected]