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Switch death test to use explicit trap. (NVIDIA#11326)
This change should make the test fail reliably, whereas the current approach is flaky and leads to not infrequent test failures. Authors: - Vyas Ramasubramani (https://github.com/vyasr) Approvers: - Jake Hemstad (https://github.com/jrhemstad) - Nghia Truong (https://github.com/ttnghia) - Bradley Dice (https://github.com/bdice) URL: rapidsai/cudf#11326
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