- SP1: Add error addresses
- SP1: Continually print sound latch value during 68k/z80 comm test
- SP1: P ROM Bus Tests (requires custom cart)
- SP1: Properly detect 1 slot vs 2 slot boards
- SP1: Re-implement color bars so they work on AES
- SP1: Add SMPTE color bars
- SP1: Go back to main menu after manual work/backup ram test
- SP1: Send error code to credit leds on MVS hardware
- SP1: Attempt to auto-detect if M1 is active (ie: on AES & MV1-B/C)
- SP1: Display when M1 is active
- SP1: Display slot number if a slot switch was done
- SP1: Display SM1 when SM1 tests were run
- SP1: Pressing ABCD after automatic tests will goto the main menu
- SP1: Memory Card testing
- SP1: Video DAC test
- SP1: Identify the bad chip(s) on ram data errors
- SP1: Display details on ram address errors
- SP1: Rework error printing to support more error_codes
- SP1: Split up code into multiple files
- SP1: Allow pseudo subs to also be called as normal subs (rts)
- Allowed removing a bunch of dupe pseudo/normal subs
- SP1: Add Hard DIPs to Misc Input screen
- SP1: Add CPU/PAL Address test
- SP1+M1: Make 68k <=> Z80 communication test less finicky about timings
- SP1+M1: Split 68k <=> Z80 communication into 2 error codes (HELLO vs ACK)
- SP1+M1: SM1 output enable test
- SP1+M1: SM1 checksum test
- M1: Fix broken ram address test
- M1: Add ram output enable test
- M1: Add ram write enable test
- M1: Use rogue YM2610 IRQ as a way to recover from a failed slot switch
- M1: Fix looping forever waiting on unset of YM2610's busy bit
Below is smkdan's original change log
- SP1: Added "MISC. INPUT TEST" to test state of memory card and system config inputs.
- SP1: Added "WATCHDOG DELAY" text which will stay on screen if system is stuck in watchdog.
- SP1: Grayed MVS specific options in the menu.
- SP1: Changed inputs to be more intuitive:
- Holding D is required for Z80 testing (previously, holding D skipped it).
- Holding C is required for backup RAM testing on AES (previously, holding C skipped it).
- For AES, holding B when doing Z80 test is no longer needed (still required for MV1B/MV1C).
- SP1: Fixed MMIO read tests accidentally testing MVS specific hardware on AES systems.
- SP1: Added some MMIO read tests with onscreen repair info (mainly for 2nd generation chips).
- SP1: Added VRAM + palette RAM test loops.
- SP1: Changed RAM test loop counters to use larger hex values for consistency.
- SP1: Added WRAM/BRAM test loop similar to what the MVS BIOS does with all DIPs on.
- SP1: Fixed regression stopping expected Z80 code from appearing (did not affect actual tests).
- SP1: Added option to try and continue Z80 testing when slot switch appears to fail.
- SP1: Fixed regression that would stop WRAM/BRAM tests from reporting errors.
- SP1: Added tests that attempt to detect unwritable RAM.
- SP1: Added controller test.
- SP1: BRAM address test incorrectly came before data test. Swapped them around.
- SP1+M1: Initial release