From b5f494e117742a689ed235381048d78d042f8f78 Mon Sep 17 00:00:00 2001 From: Paul Date: Thu, 9 Jan 2020 21:51:07 -0500 Subject: [PATCH] UP threhold on analog release unit test (#1464) The analog release unit test was sometimes too fast to pass in some random regimes. Make the floor a bit longer. --- src/headless/UnitTests.cpp | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/src/headless/UnitTests.cpp b/src/headless/UnitTests.cpp index 1ae7a5699ae..5646f1e2e43 100644 --- a/src/headless/UnitTests.cpp +++ b/src/headless/UnitTests.cpp @@ -1083,7 +1083,7 @@ TEST_CASE( "ADSR Envelope Behaviour", "[mod]" ) auto a = rand() * 1.0 / RAND_MAX + 0.03; auto d = rand() * 1.0 / RAND_MAX + 0.03; auto s = 0.7 * rand() * 1.0 / RAND_MAX + 0.2; // we have tested the s=0 case above - auto r = rand() * 1.0 / RAND_MAX; + auto r = rand() * 1.0 / RAND_MAX + 0.03; testAnalog( a, d, s, r); }