CITATION.cff

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title: >-
  FlexSensor: Automated measurement software for rapid
  photonic circuits capturing
message: >-
  If you use this software, please cite it using the
  metadata from this file.
type: software
authors:
  - given-names: Christoph
    family-names: Schmidt
    affiliation: Graz University of Technology
    email: christoph.schmidt@tugraz.at
    orcid: 'https://orcid.org/0009-0000-6625-3316'
  - given-names: Jakob Wilhelm
    family-names: Hinum-Wagner
    affiliation: ams-OSRAM AG
  - given-names: 'Reinhard '
    family-names: Klambauer
    affiliation: Graz University of Technology
  - given-names: Alexander
    family-names: Bergmann
    affiliation: Graz University of Technology
identifiers:
  - type: doi
    value: 10.1016/j.softx.2024.101879
repository-code: 'https://github.com/agentsmith29/flexsensor'
url: 'https://github.com/agentsmith29/flexsensor'
abstract: >-
  This paper introduces the automation measurement software
  FlexSensor for capturing resonant spectra, an innovative
  and extensible software program developed explicitly for
  measuring and evaluating wafer-level Silicon Photonic
  (SiPh) circuits. Wafer-level Silicon Photonics allows the
  integration of numerous optical components and structures
  on a single wafer. However, researchers and engineers need
  precise and repeatable measurements to characterize them
  and face significant challenges when dealing with large
  numbers of complex systems on a single wafer. A toolchain
  gap hampers the measuring of such highly integrated
  photonic structures: While the setup necessitates the
  integration of an optimized hardware and software
  toolchain, there is neither software nor a standardized
  way to implement a reproducible measurement routine for a
  massive set of measurements.


  FlexSensor allows integration and control of external
  hardware (tunable lasers, analog–digital converters) and
  supports measurement data storage and evaluation. The
  software enables researchers and engineers to efficiently
  analyze the spectral response of photonic structures and
  facilitate rapid measuring.
keywords:
  - Silicon photonics
  - Wafer-level measurements
  - Measurement automation
  - Graphical user interface
license: CC-BY-4.0